A diagnostic arrangement
AssigneeKemira Oyj
InventorsTorsten HAVERINEN-NIELSEN, Marjatta PIIRONEN, Iiris JOENSUU, Vesa-Matti TIKKALA
Life of this patent
Estimating the term…
Abstract
The invention provides a diagnostic arrangement, which utilizes pre-processed measurement data, ML values and explanation values. By using all these values/data it is possible to analyse phenomenon, events, and behaviour of the process in such a way that a number of aspects can be taken into account.
Claims15
A diagnostic arrangement for a multivariable process, the arrangement having a data processing module in order to process measurement data of the multivariable process and to perform pre-processed measurement data, and a machine learning module in order to perform machine learning values from the pre-processed measurement data, wherein the diagnostic arrangement comprises an explanation value module for forming explanation values from the machine learning values, and a deviation calculation module to calculate deviations between the explanation values and normal explanation values, deviations between the machine learning values and normal machine learning values, and deviations between the pre-processed measurement data and normal pre-processed measurement data,
- the diagnostic arrangement further comprising at least one estimator, which each estimator is arranged to follow a specific disturbance condition or quality condition of the multivariable process utilizing said deviations, and to form an estimation of severity of the disturbance condition or the quality condition.
Dependencies are inferred from the claim text.