Methods, apparatus, and articles of manufacture to identify causes of defects in industrial environments
AssigneeIntel Corporation
InventorsPriyanka Mudgal, Mark Yarvis, Rita H. Wouhaybi
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Abstract
Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instructions. For example, the programmable circuitry is to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data.
Claims20
An apparatus comprising:
- interface circuitry to access data associated with an object in an environment;
- machine-readable instructions;
- and
- programmable circuitry to utilize the machine-readable instructions to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data.
A non-transitory machine-readable storage medium comprising machine-readable instructions to cause programmable circuitry to at least identify a cause of a defect of an object based on a timeline of the object in an environment, the timeline based on data associated with the object.
A method comprising:
- accessing data associated with an object in an environment;
- and
- identifying, by utilizing an instruction with programmable circuitry, a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data.
Dependencies are inferred from the claim text.