Systems and methods to measure specimen dimensions

A specimen measurement device, comprising:

• a specimen width meter configured to measure a width dimension of a specimen, the specimen width meter comprising:
• a first measurement probe;
• a first clamp and a second clamp configured to, in response to actuation of at least one of the first clamp or the second clamp, clamp a specimen in alignment with the first measurement probe;
• a first actuator configured to actuate at least one of the first clamp or the second clamp;
• and
• a first position sensor configured to determine a location of the first measurement probe;
• a specimen thickness meter configured to measure a thickness dimension of a specimen, the specimen thickness meter comprising:
• a second measurement probe oriented perpendicularly to the first measurement probe;
• a third clamp and a fourth clamp configured to, in response to actuation of at least one of the third clamp or the fourth clamp, clamp the specimen in alignment with the second measurement probe;
• a second actuator configured to actuate at least one of the third clamp or the fourth clamp and the second measurement probe;
• and
• a second position sensor configured to determine a location of the second measurement probe;
• and
• processing circuitry configured to:
• control the first actuator to clamp the first and second clamps on the specimen and to engage the first measurement probe with the specimen;
• control the second actuator to clamp the third and fourth clamps on the specimen and to engage the second measurement probe with the specimen;
• determine a width of the specimen based on the first position sensor;
• and
• determine a thickness of the specimen based on the second position sensor.