Signal transfer control method, signal transfer apparatus, and test system and platform

A test system, comprising:

• a signal transfer apparatus, wherein the apparatus comprises:
• a first terminal group, a second terminal group, a plurality of switches, a controller, and a drive circuit;
• wherein
• the first terminal group comprises a plurality of first terminals, the second terminal group comprises a plurality of second terminals, and one of the plurality of switches is connected in series between a first end of each of the first terminals and a first end of each of the second terminals;
• the controller is configured to:
• determine, from the plurality of switches based on apparatus connection setting, a plurality of target switches that need to be turned on, and send a control signal for turning on the plurality of target switches to the drive circuit;
• and
• the drive circuit is connected to both the plurality of switches and the controller, and is configured to drive, based on the received control signal, the plurality of target switches to be turned on, so that signal paths between the first terminals and the second terminals that are connected to the target switches are connected, wherein
• the apparatus connection setting indicates a hardware-in-loop test system and a to-be-tested apparatus that are connected to the signal transfer apparatus, the first terminals connected to the hardware-in-loop test system, and the second terminals connected to the to-be-tested apparatus;
• and
• a hardware-in-loop test system, connected to the signal transfer apparatus through an I/O interface.

A signal transfer control method, comprising:

• determining, from a plurality of switches of a first apparatus based on apparatus connection setting, a plurality of target switches that need to be turned on, wherein one of the plurality of switches is connected in series between a first end of each of a plurality of first terminals in a first terminal group of the first apparatus and a first end of each of a plurality of second terminals in a second terminal group of the first apparatus;
• and
• generating a control signal for turning on the plurality of target switches, wherein
• the apparatus connection setting indicates a hardware-in-loop test system and a to-be-tested apparatus that are connected to the first apparatus, the first terminals connected to the hardware-in-loop test system, and the second terminals connected to the to-be-tested apparatus.