Semiconductor device and method for manufacturing the same
AssigneeSK hynix Inc.
InventorJae Ho KIM
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a first contact plug penetrating a source structure, the first plug having a first portion having a first width and a second portion having a second width that is larger than the first width, a stack formed on the source structure and the first contact plug, a second contact plug penetrating the stack, the second contact plug connected to the first contact plug, a first spacer surrounding the first portion and the second portion of the first contact plug, and a second spacer surrounding the first spacer to surround the second portion of the first contact plug.
Claims22
A semiconductor device comprising:
- a first contact plug penetrating a source structure, the first contact plug having a first portion having a first width and a second portion having a second width that is larger than the first width;
- a stack formed on the source structure and the first contact plug;
- a second contact plug penetrating the stack, the second contact plug connected to the first contact plug;
- a first spacer surrounding the first portion and the second portion of the first contact plug;
- and
- a second spacer surrounding the first spacer to surround the second portion of the first contact plug.
A semiconductor device comprising:
- a first contact plug penetrating a source structure;
- a stack formed on the source structure and the first contact plug;
- a second contact plug penetrating the stack, the second contact plug connected to the first contact plug;
- a first spacer surrounding a sidewall of the first contact plug, the first spacer including a first portion having a first width and a second portion having a second width that is smaller than the first width;
- and
- a second spacer surrounding the second portion of the first spacer.
A method for manufacturing a semiconductor device, the method comprising:
- forming a sacrificial layer in a source structure;
- forming a first opening that penetrates the source structure;
- forming a first spacer in the first opening;
- forming a first contact plug in the first spacer;
- forming a stack on the source structure;
- forming a second opening that penetrates the stack and exposes the sacrificial layer;
- forming a third opening by removing the sacrificial layer through the second opening;
- and
- forming a second spacer in the third opening.
A method for manufacturing a semiconductor device, the method comprising:
- forming a first insulating spacer that penetrates a source structure to a first depth;
- forming a second insulating spacer that penetrates the source structure to a second depth that is different from the first depth;
- forming a first contact plug in the first insulating spacer;
- forming a stack on the source structure;
- and
- forming a second contact plug that penetrates the stack and is electrically connected to the first contact plug.
Dependencies are inferred from the claim text.