Data analysis method, data analysis system, and data analysis system server
AssigneeShimadzu Corporation
InventorsRyuji SAWADA, Hiroaki TSUSHIMA
Life of this patent
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Abstract
A data analysis method includes a storage step of storing a plurality of learning algorithm groups each including a type of measurement data, a type of analysis of the measurement data, and a learning algorithm associated with each other, a learning algorithm selection step of selecting the learning algorithm based on input information, and a trained model generation step of generating a trained model based on training data and the learning algorithm.
Claims8
A data analysis method implemented between a system management company and a customer who desires to acquire an analysis result of measurement data acquired from a measuring device, the data analysis method comprising:
- a storage step of storing in advance a plurality of learning algorithm groups each including a type of the measurement data, a type of analysis of the measurement data, and a learning algorithm associated with each other;
- a training data receiving step of receiving an input of training data;
- an input information receiving step of receiving an input of input information including information about the type of the measurement data and information about the type of analysis of the measurement data;
- a learning algorithm selection step of selecting the learning algorithm to be used for learning from among the plurality of learning algorithm groups based on the input information;
- a trained model generation step of generating a trained model based on the training data and the selected learning algorithm;
- and
- an analysis result acquisition step of analyzing the measurement data based on the trained model and acquiring the analysis result.
A data analysis system configured to perform data analysis between a system management company and a customer who desires to acquire an analysis result of measurement data acquired from a measuring device, the data analysis system comprising:
- a server configured to generate a trained model to analyze the measurement data;
- and
- a data processor configured to request the server to analyze the measurement data;
- wherein
- the server includes:
- a storage configured to store in advance a plurality of learning algorithm groups each including a type of the measurement data, a type of analysis of the measurement data, and a learning algorithm associated with each other;
- an input receiver configured to receive an input of input information including information about the type of the measurement data and information about the type of analysis of the measurement data, and an input of training data;
- a learning algorithm selector configured to select the learning algorithm to be used for learning from among the plurality of learning algorithm groups based on the input information;
- a trained model generator configured to generate the trained model based on the training data and the selected learning algorithm;
- and
- an analysis result acquirer configured to analyze the measurement data based on the trained model generated by the trained model generator and acquire the analysis result.
A data analysis system server configured to perform data analysis between a system management company and a customer who desires to acquire an analysis result of measurement data acquired from a measuring device, the data analysis system server comprising:
- a storage configured to store in advance a plurality of learning algorithm groups each including a type of the measurement data, a type of analysis of the measurement data, and a learning algorithm associated with each other;
- an input receiver configured to receive an input of input information including information about the type of the measurement data and information about the type of analysis of the measurement data, and an input of training data;
- a learning algorithm selector configured to select the learning algorithm to be used for learning from among the plurality of learning algorithm groups based on the input information;
- a trained model generator configured to generate the trained model based on the training data and the selected learning algorithm;
- and
- an analysis result acquirer configured to analyze the measurement data based on the trained model generated by the trained model generator and acquire the analysis result.
Dependencies are inferred from the claim text.