Method for reduction of sic mosfet gate voltage glitches
AssigneeTeradyne, Inc.
InventorMartin Hollander
Life of this patent
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AssigneeTeradyne, Inc.
InventorMartin Hollander
Estimating the term…
Aspects of the present disclosure are directed to a circuit and methods of operating the same to provide an off-state circuit path with a programmable impedance in combination with a negative gate-to-source voltage Vgs for power transistors in an inverter configuration to prevent gate voltage glitches. Gate voltage glitch may occur due to Miller current generation across the gate path of a power transistor in the off state during rapid voltage transient dV/dt when the other, complementary power transistor is switched on or off. According to one aspect, using a negative gate-to-source voltage to turn-off a power transistor may mitigate gate voltage spikes caused by a large voltage transient when the complimentary power transistor is turned on, thus preventing parasitic turn-on of the power transistor. According to another aspect, an off-state circuit path with a programmable impedance is provided that is controllable to be in a low impedance state prior to a complementary power transistor is being turned on, such that the gate voltage glitches of the power transistor is prevented by the low impedance off-state circuit path.
An automated test equipment (ATE) for testing a device under test (DUT) comprising a first transistor having a gate terminal and a source terminal, the ATE comprises:
A method for driving a first power transistor and a second power transistor coupled in an inverter configuration using a first control circuit and a second control circuit, each control circuit comprising a first circuit path and a second circuit path connected in parallel, the method comprising:
Dependencies are inferred from the claim text.