A method for correcting measurement errors which occur in a spectroscopic measurement device on account of temperature drift and/or component wear, the measurement device comprising a control unit, a light source, a sample holder arranged in the beam path of the light source and defining a measurement location, and a spectral measurement module, the measuring module having a photosensor with a plurality of organic photodiodes arranged on a substrate and a temperature sensor arranged at the photosensor, wherein the following steps are carried out during a sample measurement:
- detecting the actual temperature at the photosensor by means of the temperature sensor;
- pivoting a dark reference sample into the beam path of the light source such that the dark reference sample is located in a reference measurement plane, and measuring a dark reference value by means of the photosensor;
- pivoting a bright reference sample into the beam path of the light source such that the bright reference sample is located in the reference measurement plane, and measuring a bright reference value by means of the photosensor;
- arranging a sample to be examined on the sample holder such that the said sample is located at a measurement location offset from the reference measurement plane, and measuring a spectral value of the sample by means of the photosensor;
- and
- correcting the recorded spectral value of the sample by means of a correction calculation by way of the control unit using calibration and reference values obtained during a pre-calibration, the measured dark reference value, the bright reference value and the detected actual temperature.