Low etch pit density 6 inch semi-insulating gallium arsenide wafers
AssigneeAXT, Inc.
InventorsRajaram Shetty, Weiguo Liu, Morris Young
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AssigneeAXT, Inc.
InventorsRajaram Shetty, Weiguo Liu, Morris Young
Estimating the term…
Methods and systems for low etch pit density 6 inch semi-insulating gallium arsenide wafers may include a semi-insulating gallium arsenide single crystal wafer having a diameter of 6 inches or greater without intentional dopants for reducing dislocation density, an etch pit density of less than 1000 cm−2, and a resistivity of 1×107 Ω-cm or more. The wafer may have an optical absorption of less than 5 cm−1 less than 4 cm−1 or less than 3 cm−1 at 940 nm wavelength. The wafer may have a carrier mobility of 3000 cm2/V-sec or higher. The wafer may have a thickness of 500 μm or greater. Electronic devices may be formed on a first surface of the wafer. The wafer may have a carrier concentration of 1.1×107 cm−3 or less.
A method for forming single crystal gallium arsenide substrates, the method comprising:
The method according to claim, 1, comprising evacuating the crucible before sealing it into the quartz ampoule.
A method for forming single crystal gallium arsenide substrates, the method comprising:
Dependencies are inferred from the claim text.