System for non radial temperature control for rotating substrates
AssigneeApplied Materials, Inc.
InventorsWolfgang R. ADERHOLD, Aaron Muir HUNTER, Joseph M. RANISH
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AssigneeApplied Materials, Inc.
InventorsWolfgang R. ADERHOLD, Aaron Muir HUNTER, Joseph M. RANISH
Estimating the term…
Embodiments of the present invention provide apparatus and method for reducing non uniformity during thermal processing. One embodiment provides an apparatus for processing a substrate comprising a chamber body defining a processing volume, a substrate support disposed in the processing volume, wherein the substrate support is configured to rotate the substrate, a sensor assembly configured to measure temperature of the substrate at a plurality of locations, and one or more pulse heating elements configured to provide pulsed energy towards the processing volume.
A method for substrate processing, comprising:
A controller comprising software configured to:
A processing chamber, comprising:
Dependencies are inferred from the claim text.