Methods and computer programs for configuration of a sampling scheme generation model
AssigneeASML Netherlands B.V.
InventorsRoy WERKMAN, Jochem Sebastiaan WILDENBERG, Reza SAHRAEIAN
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AssigneeASML Netherlands B.V.
InventorsRoy WERKMAN, Jochem Sebastiaan WILDENBERG, Reza SAHRAEIAN
Estimating the term…
A method to infer a current sampling scheme for one or more current substrates is provided, the method including: obtaining a first model trained to infer an optimal sampling scheme based on inputting context and/or pre-exposure data associated with one or more previous substrates, wherein the first model is trained in dependency of an outcome of a second model configured to discriminate between the inferred optimal sampling scheme and a pre-determined optimal sampling scheme; and using the obtained first model to infer the current sampling scheme based on inputting context and/or pre-exposure data associated with the one or more current substrate.
A method comprising:
A method for inferring a current sampling scheme for one or more current substrates, the method comprising:
A method for providing a decision on stopping or continuing performing measurements on sampling locations on one more substrates, the method comprising:
Dependencies are inferred from the claim text.