On-site compensation of measurement devices
AssigneeFaro Technologies, Inc.
InventorsJafar Amiri PARIAN, Martin OSSIG, Hani KAABI, Johannes BUBACK, Fabian HARGART
Life of this patent
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AssigneeFaro Technologies, Inc.
InventorsJafar Amiri PARIAN, Martin OSSIG, Hani KAABI, Johannes BUBACK, Fabian HARGART
Estimating the term…
A system includes one or more processors that are configured to compensate a measurement tool by performing a method. The method includes capturing a first data using the measurement tool. The method further includes capturing a second data using the measurement tool. The method further includes detecting a first natural feature in the first data. The method further includes computing a difference in positions of the first natural feature in the first data and the second data respectively. The method further includes computing a compensation parameter to adjust the measurement tool based on the difference computed.
A system comprising:
A computer-implemented method for on-site compensation of a measurement tool, the computer-implemented method comprising:
A computer program product comprising a computer-readable memory device that comprises one or more computer-executable instructions, which when executed by one or more processing units cause the one or more processing units to perform a method for on-site compensation of a measurement tool, the computer-implemented method comprising:
Dependencies are inferred from the claim text.