Process apparatus
AssigneeV Technology Co., Ltd.
InventorsMichinobu MIZUMURA, Toshinari ARAI, Takanori MATSUMOTO, Takuro TAKESHITA
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AssigneeV Technology Co., Ltd.
InventorsMichinobu MIZUMURA, Toshinari ARAI, Takanori MATSUMOTO, Takuro TAKESHITA
Estimating the term…
A process apparatus includes a differential pumping device and a focused ion beam column. The differential pumping device includes a head which has a plurality of annular grooves formed in a surface thereof which faces a substrate to be processed. The annular grooves surround the center of the head. An orifice is formed inside an innermost one of the annular grooves and defines a processing space serving to achieve processing of a process surface of the substrate. A vacuum pump is connected to at least one of the annular grooves to suck gas from the one of the annular grooves with the surface of the head facing the processing surface of the substrate to create a high-level vacuum in the processing space. The focused ion beam column is equipped with a cylindrical chamber leading to the orifice in communication with the processing space. The chamber has disposed therein a focused ion beam optical system which works to emit a focused ion beam through the orifice. A precursor gas supply is connected to the innermost one of the annular grooves to eject a precursor gas toward the process surface so that the precursor gas flows into the processing space along the process surface.
A process apparatus comprising:
Dependencies are inferred from the claim text.