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US 2023/0393482 A1Published application
Exposure mask and method of manufacturing display device using the same
AssigneeSamsung Display Co., Ltd.
InventorsSOOHONG CHEON, HYUNGJIN SONG
Life of this patent
Estimating the term…
Abstract
An exposure mask includes a base layer including a first area and a second area spaced apart from a first area in a first direction, a first inspection transmission pattern defined in a first area of a base layer and arranged in a ring shape having at least one connection part in plan view, and a second inspection transmission pattern defined in a second area of a base layer and arranged in a polygonal shape or a circular shape in plan view.
Claims20
An exposure mask comprising:
- a base layer including a first area and a second area spaced apart from the first area in a first direction;
- a first inspection transmission pattern defined in the first area of the base layer and arranged in a ring shape having at least one connection part in plan view;
- and
- a second inspection transmission pattern defined in the second area of the base layer and arranged in a polygonal shape or a circular shape in plan view.
1 more element
A method of manufacturing a display device, the method comprising:
- forming at least one reference pattern on a substrate including a first shot area and a second shot area adjacent to the first shot area;
- forming a first material layer on the at least one reference pattern;
- forming a first photoresist layer on the first material layer;
- matching an exposure mask on the first shot area of the substrate and exposing the first photoresist layer using the exposure mask;
- matching the exposure mask on the second shot area of the substrate and exposing the first photoresist layer using the exposure mask;
- developing the first photoresist layer to form a first inspection resist pattern arranged in a polygonal or a circular shape in which a portion of an outer shape is recessed inward in plan view, and exposing a portion of the first material layer;
- determining whether the exposure mask has an alignment error from the first inspection resist pattern;
- and
- forming a first contact hole in the first material layer using the first photoresist layer as a mask and removing the first photoresist layer to form a first insulating layer in which the first contact hole is defined in case that it is determined that there is no alignment error of the exposure mask.
6 more elements
Dependencies are inferred from the claim text.