Sample measuring apparatus
AssigneeSysmex Corporation
InventorsMasato HAYASHI, Shuhei KANEKO, Fumiaki IWASE
Life of this patent
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AssigneeSysmex Corporation
InventorsMasato HAYASHI, Shuhei KANEKO, Fumiaki IWASE
Estimating the term…
A sample measuring apparatus according to one or more embodiments may include a measuring unit that measures a sample in a container, a power supply that supplies power to the measuring unit, and an apparatus housing that accommodates the measuring unit and the power supply inside. In one or more embodiments, the power supply may be arranged in an area in the apparatus housing, the area that is the power supply is arranged is different from an area that the measuring unit is arranged in a plan view, and the power supply is arranged at a higher position than a position that the measuring unit is arranged.
A sample measuring apparatus comprising:
Dependencies are inferred from the claim text.