Comparative measurement using particles within one or more compartments
AssigneeAnalog Devices International Unlimited Company
InventorsAlan J. O’Donnell, Shaun Bradley, Alfonso Berduque, Jan Kubík, Jochen Schmitt, Stanislav Jolondcovschi, Javier Calpe Maravilla, Padraig L. Fitzgerald, Gavin Patrick Cosgrave, Michael P. Lynch, Eoin Edward English
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