Foreign matter inspection device

A foreign matter inspection device configured to inspect whether foreign matter is included in an inspection object, the foreign matter inspection device comprising:

• a carriage unit configured to carry the inspection object in a predetermined carrying direction;
• an X-ray application unit configured to apply X-rays to the inspection object carried by the carriage unit;
• an X-ray detection unit configured to detect X-rays transmitted by the inspection object and to output X-ray image data based on the detection result;
• an infrared ray application unit configured to apply infrared rays to the inspection object carried by the carriage unit;
• an infrared ray detection unit configured to detect infrared rays from the inspection object and to output infrared image data based on the detection result;
• a protection unit formed of a member blocking X-rays and transmitting infrared rays and configured to cover the infrared ray application unit and the infrared ray detection unit;
• and
• an image generating unit configured to generate an X-ray image of the inspection object based on the X-ray image data and to generate an infrared image of the inspection object based on the infrared image data.