Method and wire-line transceiver for performing serial loop back test

A method for performing a serial loop back test in a wire-line transceiver, the method comprising:

• sending, by an on-chip transmitter of the wire-line transceiver, data to an on-chip receiver for performing the serial loop back test;
• inducing, by a fractional feed forward equalizer circuit (fractional FFE circuit) of the wire-line transceiver, a delay of less than one symbol time of data, thereby enhancing an eye opening from a serial loop back line during the serial loop back test compared to a situation where the fractional FFE circuit is not present or is not used;
• and
• performing, by the wire-line transceiver, the serial loop back test with the enhanced eye opening from the serial loop back line.