Apparatus and method for inspection

An inspection apparatus that judges the presence or absence of abnormality based on a spectrogram of waveform data, comprising:

• an inspection judgment section that calculates anomaly score of the spectrogram of the waveform data using a judgment model obtained by machine learning and judges the presence or absence of abnormality based on the calculated anomaly score;
• a processed data creation section that creates a plurality of pieces of processed data with a mask corresponding to characteristics of the waveform data set on the spectrogram of the waveform data so as to sequentially shift the mask in a direction corresponding to the mask;
• an anomaly score/change degree calculation section that calculates anomaly score of the processed data created by the processed data creation section and calculates each change rate or change degree of the waveform data of the processed data from the spectrogram based on the anomaly score of the calculated processed data and the anomaly score of the spectrogram of the waveform data calculated by the inspection judgment section;
• a judgment evidence drawing section that draws a judgment evidence image obtained by coloring each area in which the mask on the spectrogram of the waveform data is set based on the change rate or change degree of the calculated processed data from the spectrogram of the waveform data, with a color or concentration corresponding to the change rate or change degree of the processed data when the mask is set;
• and
• a result display section that displays the judgment result of the inspection judgment section and the judgment evidence image drawn by the judgment evidence drawing section.