Learning method, learning apparatus and program
AssigneeNippon Telegraph and Telephone Corporation
InventorTomoharu IWATA
Life of this patent
Estimating the term…
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AssigneeNippon Telegraph and Telephone Corporation
InventorTomoharu IWATA
Estimating the term…
A learning method includes: receiving as input a set of data sets {D1, . . . , DT} wherein Dt for a task tin a task set {1, . . . , T} includes feature amount vectors of cases of t; sampling t from the task set, and sampling a first subset from Dt and a second subset from Dt excluding the first subset; generating a task vector representing a property oft corresponding to the first subset by a first neural network; nonlinearly transforming feature amount vectors included in data included in the second subset by a second neural network using the task vector; calculating scores representing degrees of anomaly of the feature amount vectors using the transformed feature amount vectors and a preset center vector; and learning parameters of the first and second neural networks so as to make an index value representing generalized performance of anomaly detection higher using the scores.
A learning method executed by a computer including a memory and a processor, the learning method comprising:
A learning apparatus comprising:
Dependencies are inferred from the claim text.