Test structure and test method
AssigneeChangxin Memory Technologies, Inc.
InventorZhongqin ZHU
Life of this patent
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AssigneeChangxin Memory Technologies, Inc.
InventorZhongqin ZHU
Estimating the term…
A test structure and a test method are provided. The test structure includes: a first interdigital structure including first and second conductive comb tooth portions, where comb tooth ends of the second and first conductive comb tooth portions are arranged alternately in sequence and spaced apart and there is a first distance between the comb tooth ends of the second and first conductive comb tooth portions; and a second interdigital structure including third and fourth conductive comb tooth portions, where comb tooth ends of the fourth and third conductive comb tooth portions are arranged alternately in sequence and spaced apart; there is a second distance between the comb tooth ends of the fourth and third conductive comb tooth portions, which is not equal to the first distance; and the first and second conductive comb tooth portions are electrically connected to the third and fourth conductive comb tooth portions respectively.
A test structure, comprising:
A test method, comprising:
Dependencies are inferred from the claim text.