Back to results
US 2023/0194244 A1Published application
Measurement Device for Measuring Light, Measurement System and Measurement Method for Detecting Light Parameters
OwnerOliver Lischtschenkoinventor
Life of this patent
Estimating the term…
Abstract
The invention relates to a measurement device (10) for measuring light (200) from a light source (2), comprising an optical unit (30) with a delay element (31) for splitting a polarized light beam (210) of the light (200) into a first partial beam (211) and a second partial beam (212), which have a defined phase shift relative to one another. Furthermore, the invention relates to a measurement system (1), as well as a measurement method (100).
Claims15
A measurement device for measuring light of a light source comprising
- an optical unit for splitting a polarized light beam of the light into a first partial beam and a second partial beam, which have a defined phase shift relative to one another, and
- a sensor unit having at least two detector elements, each having a polarization with a different orientation about an optical axis, wherein the first and second partial beams can be aligned to one another on the detector elements by the optical unit in order to detect interference of the first and second partial beams by the detector elements.
Dependencies are inferred from the claim text.