Non-contact dimensional measurement device with micrometric resolution

A non-contact dimensional measurement device with micrometric resolution for measuring a distance from an object provided with at least one reflective surface, the non-contact dimensional measurement device with micrometric resolution extending along an axis (X-X) and comprising:

• a light source that produces an emitted light beam toward the object such that the at least one reflective surface of the object produces a reflected light beam in a reflection direction opposite to an emission direction;
• a light barrier element positioned on an opposite side of the light source with respect to the emission direction, wherein said light barrier element comprises at least one slit shaped such that the light barrier element only allows the reflected light beam to pass through said at least one slit;
• and
• a detection group comprising:
• an imaging sensor on which a projection of the reflected light beam that passes through the at least one slit is detected;
• and
• a processing and control assembly operatively connected to the imaging sensor and configured to analyze shape and position of said projection to identify distance and characteristics of the at least one reflective surface of the object.