Automatic program voltage selection network
AssigneeSamsung Electronics Co., Ltd.
InventorsAmit Berman, Evgeny Blaichman
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AssigneeSamsung Electronics Co., Ltd.
InventorsAmit Berman, Evgeny Blaichman
Estimating the term…
A method, apparatus, non-transitory computer readable medium, and system for selecting program voltages for a memory device are described. Embodiments of the method, apparatus, non-transitory computer readable medium, and system may map a set of information bits to voltage levels of one or more memory cells based on a plurality of embedding parameters, program the set of information bits into the one or more memory cells based on the mapping, detect the voltage levels of the one or more memory cells to generate one or more detected voltage levels, and identify a set of predicted information bits based on the one or more detected voltage levels using a neural network comprising a plurality of network parameters, wherein the network parameters are trained together with the embedding parameters.
A method of training an artificial neural network (ANN) for a memory device, comprising:
A memory device, comprising:
Dependencies are inferred from the claim text.