Method for Simultaneously Determining Parameters of at Least One Resin Layer Applied to at Least One Carrier Material
AssigneeFlooring Technologies Ltd.
InventorNorbert Kalwa
Life of this patent
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Abstract
Provided is a method for the simultaneous determination of parameters, in particular of at least two, three or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.
Claims15
A method for the simultaneous determination of parameters, in particular of at least two, three or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, in particular preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.
Dependencies are inferred from the claim text.