Test apparatus and jumper thereof
AssigneeStar Technologies Inc.
InventorsCHOON LEONG LOU, YI MING LAU
Life of this patent
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Abstract
The present disclosure provides a test apparatus and a jumper thereof. The test apparatus includes a base board and the jumper. The base board has a first slot and a second slot. The first slot has a plurality of electrical contacts, and is configured to receive a plurality of pins of a device under test. The jumper is inserted into the second slot. The jumper includes a body and a plurality of first circuits. The first circuits are disposed on the body and electrically connect the electrical contacts of the first slot to a plurality of pins of a tester.
Claims17
A test apparatus, comprising:
- a base board, having a first slot and a second slot, wherein the first slot is electrically connected to the second slot, and the first slot having a plurality of electrical contacts is configured to receive a plurality of pins of a device under test;
- a jumper, inserted into the second slot, comprising:
- a body;
- and
- a plurality of first circuits, disposed on the body and electrically connecting the electrical contacts of the first slot to a plurality of pins of a tester.
A jumper, detachably attached to a base board, the base board having a first slot, the first slot being electrically connected to the jumper, the first slot having a plurality of electrical contacts, the first slot being configured to receive a plurality of pins of a device under test, and the jumper comprising:
- a body;
- and
- a plurality of first circuits, disposed on the body and electrically connecting the electrical contacts of the first slot to a plurality of pins of a tester.
Dependencies are inferred from the claim text.