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US 2023/0119569 A1Published application
High and low frequency soil and plant analysis systems with integrated measurements
AssigneePrecision Planting LLC
InventorDale M. Koch
Life of this patent
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Abstract
A soil or plant analysis apparatus to perform low and high frequency measurements is described herein. In one embodiment, the soil analysis apparatus comprises a first sub-system to perform low frequency soil measurements and a second sub-system to perform high frequency soil measurements. The high frequency measurements of the second sub-system are at least 1.25 times the low frequency measurements of the first sub-system.
Claims29
A soil analysis apparatus comprising:
- a first sub-system to perform low frequency soil measurements;
- and
- a second sub-system to perform high frequency soil measurements, wherein the high frequency measurement of the second sub-system is at least 1.25 times the low frequency measurement of the first sub-system.
A soil analysis apparatus, comprising
- a first sub-system to perform a first accuracy level of soil measurements;
- and
- a second sub-system to perform a second accuracy level of soil measurements, wherein
- the first accuracy level of the first sub-system is at least 25 percent better than the second accuracy level of the second sub-system.
1 more element
A plant analysis apparatus comprising:
- a first sub-system to perform low frequency plant measurements;
- and
- a second sub-system to perform high frequency plant measurements, wherein the high frequency measurement of the second sub-system is at least 1.25 times the low frequency measurement of the first sub-system.
A processing system, comprising:
- a communication unit to receive soil or plant measurement data from first and second sub-systems of a soil analysis apparatus;
- and
- a processor coupled to the communication unit, the processor is configured to cause the soil or plant measurement data from the second sub-system to be plotted on a spatial grid having a plurality of cells and to cause the soil or plant measurement data from the first sub-system to be plotted on the same spatial grid, wherein the soil or plant measurement data of the second sub-system has a frequency that is at least 1.25 times a frequency of the soil or plant measurement data of the first sub-system.
Dependencies are inferred from the claim text.