Generation method, estimation method, generation device, and estimation device

A generation device comprising:

• a processor;
• and
• memory connected to the processor;
• wherein using the memory, the processor:
• acquires, by performing experimental device machining according to plan information including first type information indicating a first type condition of the experimental device machining and second type information indicating a second type condition of the experimental device machining, third type information indicating a third type result of the experimental device machining according to the plan information and fourth type information indicating a fourth type result of the experimental device machining according to the plan information;
• acquires extended plan information including extended first type information including new first type information added to the first type information and extended second type information including new second type information added to the second type information, wherein a uniformity of the extended second type information and extended third type information obtained as the third type result of the experimental device machining performed according to the extended plan information is equal to or greater than a threshold value;
• acquires, by performing the experimental device machining according to the extended plan information, the extended third type information indicating the third type result of the experimental device machining according to the extended plan information and extended fourth type information indicating the fourth type result of the experimental device machining according to the extended plan information;
• derives an extended first relationship that is a relationship between the extended first type information, the extended second type information, and the extended third type information;
• derives an extended second relationship that is a relationship between the extended first type information, the extended second type information, and the extended fourth type information;
• generates a model for estimating the fourth type information indicating the fourth type result of actual device machining by receiving the second type information measured during the actual device machining and the third type information measured during the actual device machining and using the extended first relationship and the extended second relationship;
• and
• outputs the model.