Metal Gate Structure of High-Voltage Device and Method for Making the Same
AssigneeShanghai Huali Integrated Circuit Corporation
InventorsYu Xia, Zhibin He
Life of this patent
Estimating the term…
Loading patent…
AssigneeShanghai Huali Integrated Circuit Corporation
InventorsYu Xia, Zhibin He
Estimating the term…
The present application provides a metal gate structure of a high-voltage device and a method for making the same, forming a dummy gate on the gate oxide layer, wherein the dummy gate is composed of a plurality of polysilicon structures spaced apart from each other; forming a protective layer on sidewalls of the plurality of polysilicon structures and on the gate oxide layer between the polysilicon structures; performing covering with an insulating layer to fill a region between the polysilicon structures, wherein the filled region forms an insulating structure; removing the polysilicon structure to form a groove; forming a metal layer, wherein the metal layer covers the insulating structure and fills the groove; and polishing the surface of the metal layer, wherein the insulating structure, the protective layer, and the metal layer form a metal gate with a planarized surface.
A method for making a metal gate structure of a high-voltage device, comprising:
A metal gate structure of a high-voltage device, comprising:
Dependencies are inferred from the claim text.