Tilt analysis method, recording medium storing tilt analysis program, and tilt analysis device
AssigneeTopcon Corporation
InventorsYoshihiro NISHI, Kohei SATO, Motohiro MIYAJIMA, Toshio YAMADA, Takashi TANAKA
Life of this patent
Estimating the term…
Loading patent…
AssigneeTopcon Corporation
InventorsYoshihiro NISHI, Kohei SATO, Motohiro MIYAJIMA, Toshio YAMADA, Takashi TANAKA
Estimating the term…
A tilt analysis method analyzing a tilt of a columnar object is disclosed. The tilt analysis method includes: acquiring a reference value on the basis of a first position of a reflector of a measurement target device attached to a column foot portion of the columnar object; acquiring, in response to an execution instruction, a column top value on the basis of a second position of the reflector of the measurement target device attached to a column top of the columnar object, the execution instruction being received by an input section and inputted via a column top value acquisition instruction section displayed on a display section of a terminal device; generating tilt information indicating in which direction the columnar object tilts based on the reference value and the column top value; and causing the display section to display the tilt information including graphic display.
A tilt analysis method of analyzing a tilt of a columnar object, the tilt analysis method comprising:
A non-transitory computer-readable recording medium storing thereon a tilt analysis program for analyzing a tilt of a columnar object, the tilt analysis program causing a computer to execute:
A tilt analysis device, comprising:
Dependencies are inferred from the claim text.