Apparatus and method for probing device-under-test

An apparatus for probing a device-under-test, comprising:

• a fixture comprising a base and a protrusion, the protrusion connected to the base and extending toward the device-under-test;
• a circuitry film attached to the fixture, the circuitry film comprising a first portion extending along a sidewall of the base of the fixture and a second portion extending across a bottom surface of the protrusion of the fixture;
• a first signal connector disposed on and electrically connected to the first portion of the circuitry film;
• and
• a plurality of probing tips disposed on the second portion of the circuitry film to probe the device-under-test, and the first signal connector being electrically coupled to the probing tips through the circuitry film.

A method for probing a device-under-test, comprising:

• attaching a circuitry film to a fixture, wherein the fixture comprises a base and a protrusion connected to the base;
• assembling a first signal connector onto a portion of the circuitry film that covers a sidewall of the base of the fixture;
• attaching the fixture to a circuit board, wherein the base of the fixture is disposed on the circuit board and the protrusion of the fixture passing through a through hole of the circuit board;
• and
• probing the device-under-test by a plurality of probing tips disposed on another portion of the circuitry film underlying the protrusion of the fixture.