Semiconductor devices and methods for manufacturing the same, and nand memory devices
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsLan Yao, Ziqun Hua, Yanwei Shi
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsLan Yao, Ziqun Hua, Yanwei Shi
Estimating the term…
A semiconductor device and a method for manufacturing the same, and a NAND memory device are disclosed. The method comprises: forming a substrate that comprises a first active region and an isolation region; forming a first groove between the isolation region and the first channel region, the first groove being partially located in the isolation region, and not penetrating through the isolation region; forming a first gate insulating layer covering the first groove and the first channel region; forming a first gate on the first gate insulating layer, the first gate covering the first channel region and filling the first groove.
A method for manufacturing a semiconductor device, comprising:
A semiconductor device, comprising:
A NAND memory device, comprising:
Dependencies are inferred from the claim text.