US 2023/0066499 A1 · METHOD FOR ESTABLISHING DEFECT DETECTION MODEL AND ELECTRONIC APPARATUS

Abstract

A method for establishing a defect detection model and an electronic apparatus are provided. A first classification model is established based on a training sample set including a plurality of training samples. The training samples are respectively input to the first classification model to obtain a classification result of each training sample. A plurality of outlier samples that are classified incorrectly are obtained from the training samples based on the classification result. A part of outlier samples that are classified incorrectly is deleted from the training samples, and the remaining training samples are used as an optimal sample set. A second classification model is established based on the optimal sample set so as to perform a defect detection through the second classification model.

Claims19

Dependent claims

A method of establishing a defect detection model, comprising:

establishing a first classification model based on a training sample set, wherein the training sample set comprises a plurality of training samples;
inputting the plurality of training samples into the first classification model respectively to obtain classification results of the respective training samples;
obtaining a plurality of outlier samples that are classified incorrectly from the plurality of training samples based on the classification result;
deleting a part of the plurality of outlier samples that are classified incorrectly from the plurality of training samples, and using the remaining training samples as an optimal sample set;
and
establishing a second classification model based on the optimal sample set, so as to perform a defect detection through the second classification model.

3 more elements

An electronic apparatus, comprising:

a storage device comprising a training sample set and a plurality of modules, wherein the training sample set comprises a plurality of training samples;
and
a processor coupled to the storage device, and configured to execute the module to perform the following operations:
establishing a first classification model based on the training sample set;
inputting the plurality of training samples into the first classification model respectively to obtain classification results of the respective training samples;
obtaining a plurality of outlier samples that are classified incorrectly from the plurality of training samples based on the classification result;
deleting a part of the plurality of outlier samples that are classified incorrectly from the plurality of training samples, and using the remaining training samples as an optimal sample set;
and
establishing a second classification model based on the optimal sample set to perform a defect detection based on the second classification model.

6 more elements

Dependencies are inferred from the claim text.

Method for establishing defect detection model and electronic apparatus

Life of this patent

Method for establishing defect detection model and electronic apparatus

Life of this patent

Abstract

Claims19