A System for Evaluating the Scan Quality of a Scanner and a Method Thereof
AssigneeSynergy4Tech Holdings Pte. Ltd.
InventorsKenneth Ngan Meng Tan, Kwok Wai TAM
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AssigneeSynergy4Tech Holdings Pte. Ltd.
InventorsKenneth Ngan Meng Tan, Kwok Wai TAM
Estimating the term…
A system for evaluating the scan quality of a scanner on a test piece is provided. The system includes a processor and a memory in communication to the processor for storing instructions executable by the processor, such that the processor is configured to receive a scanned image of the test piece from the scanner, display the scanned image, generate a first score value based on the scanned image, display an evaluation input interface configured to receive user evaluation input based on the evaluation of the scanned image, and generate a second score value based on the user evaluation input, such that the first score value and the second score value are utilized to evaluate the scan quality of the scanner. Further, a method for evaluating the scan quality of the scanner is provided.
A test system comprising:
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A computer-implemented method for evaluating a scan quality of an X-ray scanner for scanning cargo, the scanner adapted to scan a test piece comprising a plurality of test panels or test elements, each of the plurality of test panels or test elements is designed to test a specific scan quality of the scanner, the method comprising:
A non-transitory computer readable storage medium comprising instructions, wherein the instructions, when executed by a processor in a system, cause the system to:
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A test piece comprising a plurality of test panels spaced apart from each other along a longitudinal axis, wherein each of the plurality of test panels is perpendicular to the longitudinal axis.
A test piece comprising a base panel comprising a first plurality of test elements and a longitudinal axis, a rotatable panel comprising a second plurality of test elements and pivotally connected to the base panel along the longitudinal axis, wherein the rotatable panel is rotatable about the longitudinal axis.
Dependencies are inferred from the claim text.