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US 2023/0058081 A1Published application
System and methods for depth generation using structured light patterns
AssigneeTexas Instruments Incorporated
InventorsShashank Dabral, Jaime De La Cruz, Jeffrey Kempf
Life of this patent
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Abstract
An example apparatus includes: a controller configured to: generate a symbol pattern as a result of placing symbols based on epipolar lines; instruct an SLM to project the symbol pattern; obtain an image of a reflection of the symbol pattern; determine a first location of a symbol in the image; determine a second location of the symbol in the image; and determine a depth of the symbol as based on the first location, the second location, and an essential matrix.
Claims20
A controller configured to:
- generate a symbol pattern as a result of placing symbols based on epipolar lines;
- instruct an SLM to project the symbol pattern;
- obtain an image of a reflection of the symbol pattern;
- determine a first location of a symbol in the image;
- determine a second location of the symbol in the image;
- and
- determine a depth of the symbol as based on the first location, the second location, and an essential matrix.
4 more elements
A system comprising:
- a spatial light modulator (SLM) configured to project a symbol pattern;
- a camera configured to obtain an image of a reflection of the symbol pattern;
- a controller coupled to the SLM and the camera, the controller configured to:
- determine a first location of a symbol in the image;
- determine a second location of the symbol in the image;
- and
- determine a depth of the symbol as based on the first location, the second location, and an essential matrix.
4 more elements
A vehicle comprising:
- a headlight comprising:
- a spatial light modulator (SLM) configured to project a symbol pattern;
- a camera configured to obtain an image of a reflection of the symbol pattern;
- and
- a controller coupled to the SLM and the camera, the controller configured to:
- determine a first location of a symbol in the symbol pattern;
- determine a second location of the symbol in the image;
- and
- determine a depth of the symbol as based on the first location, the second location, and an essential matrix.
6 more elements
Dependencies are inferred from the claim text.