High Throughput Quantitative Microscopy System
AssigneePhoseon Technology, Inc.
InventorsMarguerite Vantangoli Policelli, Marshall Anderson, Tyler Wilson, Jeffrey Harris, Michael Sjaastad
Life of this patent
Estimating the term…
Abstract
Methods and systems are provided for an imaging system. In one example, the imaging system includes a plurality of microscope assemblies arranged radially around a central axis of the imaging system, coupled to vertically oriented plates with a set of objectives arranged at tops of the plurality of microscope assemblies and wherein the plates are oriented to extend away from the central axis in a radial direction to form an x-shaped configuration.
Claims20
An imaging system, comprising:
- a plurality of microscope assemblies arranged radially around a central axis of the imaging system, coupled to vertically oriented plates with a set of objectives arranged at tops of the plurality of microscope assemblies and wherein the plates are oriented to extend away from the central axis in a radial direction to form an x-shaped configuration.
A multi-detector quantitative microscopy system, comprising:
- two or more microscope assemblies oriented diagonally along a square base plate of the multi-detector quantitative microscopy system with an inner side of each of the two or more microscope assemblies positioned at a central region of the square base plate and an outer side of each of the two or more microscope assemblies proximate to a corner of the square base plate;
- and
- a set of objectives arranged at a top of the multi-detector quantitative microscopy system, each of the set of objectives coupled to one of the two or more microscope assemblies along the inner side, wherein a spacing between the set of objectives is greater along a first horizontal axis than along a second horizontal axis, perpendicular to the first horizontal axis.
A multi-detector imaging system, comprising:
- a set of objectives arranged around a central axis of the multi-detector imaging system, spaced apart by a greater distance along a first horizontal axis than a second horizontal axis, each of the set of objectives coupled to a top portion of a microscope assembly, and wherein the set of objectives is configured to capture a portion of an image of a microplate synchronously to generate a complete image of the microplate.
Dependencies are inferred from the claim text.