Imaging system with wide x-ray beam and circumferentially arranged detection mechanism

A method, comprising:

• providing an x-ray source having a beam width greater than or equal to a threshold beam size, wherein multiple objects are irradiated by the x-ray source in respective controlled inspection positions;
• moving the multiple objects into and out of the respective controlled inspection positions, via at least one positioning member;
• and
• acquiring respective images of the multiple objects in the respective controlled inspection positions, via a detection mechanism in an imaging system, the detection mechanism including one or more detectors arranged circumferentially around a central axis.

An imaging system, comprising:

• x-ray source means for generating a beam with a beam width greater than or equal to a threshold beam size wherein multiple objects are irradiated in respective controlled inspection positions by the x-ray source means;
• detector means for acquiring respective images of the multiple objects in the respective controlled inspection positions, the detector means including one or more detectors arranged circumferentially around a central axis;
• and
• positioning means for moving the multiple objects into and out of the respective controlled inspection positions.