Simulation test system and simulation test method
AssigneeCompal Electronics, Inc.
InventorsChien-Lee Liu, Wen-Hua Kao, Tzu-Chiang Mi, Wei-Chih Shih, Hsun-Hung Wang, Hao-Jung Chiou, Yi-Hsun Lin
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AssigneeCompal Electronics, Inc.
InventorsChien-Lee Liu, Wen-Hua Kao, Tzu-Chiang Mi, Wei-Chih Shih, Hsun-Hung Wang, Hao-Jung Chiou, Yi-Hsun Lin
Estimating the term…
A simulation test system and a simulation test method are provided. The simulation test system includes a control device, a power setting device, and a data capture device. The control device generates a context control signal corresponding to one of a plurality of operating contexts. The power setting device generates at least one of a simulated charging power and a simulated load in response to the context control signal and provides at least one of the simulated charging power and the simulated load to a device under test to configure the device under test to generate test data in response to at least one of the simulated charging power and the simulated load. The data capture device captures the test data and provides the test data to the control device.
A simulation test system for testing a device under test, the simulation test system comprising:
A simulation test method for testing a device under test, the simulation test method comprising:
Dependencies are inferred from the claim text.