Parameter setting method and apparatus, system, and storage medium
AssigneeChangxin Memory Technologies, Inc.
InventorHao He
Life of this patent
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Abstract
The present application provides a parameter setting method and apparatus, a system, and a storage medium. The parameter setting method includes: obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory; generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; and sending the first parameter setting instruction to a test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.
Claims18
A parameter setting method, wherein the parameter setting method is applied to a host computer, the host computer is connected to a test device, and the test device comprises a non-volatile memory;
- and the parameter setting method comprises:
- obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in the non-volatile memory;
- generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter;
- and
- sending the first parameter setting instruction to the test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.
A parameter setting apparatus, wherein the parameter setting apparatus comprises:
- an obtaining module, configured to obtain first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory;
- a processing module, configured to generate a first parameter setting instruction according to the first setting value and the storage location of each memory parameter;
- and
- a sending module, configured to send the first parameter setting instruction to a test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.
Dependencies are inferred from the claim text.