Memory controller with read error handling
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsBoxuan Cheng, Wei Tao, Weizhen Kong, Jian Cao
Life of this patent
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Abstract
A method for handling a read error on a block of a memory device is disclosed. In response to a read failure indicating that at least one error handling mechanism has handled the read error on the block and fails to read data stored in the block, a memory test is trigged to be performed on the block. The memory test is configured to determine whether the block malfunctions.
Claims20
A method for handling a read error on a block of a memory device, comprising:
- in response to a read failure indicating that at least one error handling mechanism has handled the read error on the block and fails to read data stored in the block, triggering to perform a memory test on the block, the memory test being configured to determine whether the block malfunctions.
A system, comprising:
- a memory device comprising an array of memory cells that comprises a plurality of blocks configured for storing data;
- and
- a controller coupled to the memory device and configured to:
- in response to a read failure indicating that at least one error handling mechanism has handled a read error on one block of the plurality of blocks and fails to read the data stored in the block, trigger to perform a memory test on the block, the memory test being configured to determine whether the block malfunctions.
A non-transitory storage medium, coupled to a processor and storing instructions that, when executed by the processor, cause the processor to:
- in response to a read failure indicating that at least one error handling mechanism has handled a read error on a block of a memory device and failed to read data stored in the block, trigger to perform a memory test on the block, the memory test being configured to determine whether the block malfunctions.
Dependencies are inferred from the claim text.