Leak test device
AssigneeChangxin Memory Technologies, Inc.
InventorsJiaping HE, Chin-Chung KU
Life of this patent
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AssigneeChangxin Memory Technologies, Inc.
InventorsJiaping HE, Chin-Chung KU
Estimating the term…
The present disclosure provides a leak test device, including: a test platform, the test platform being configured to carry and place a polishing head to be tested for leak, the polishing head being divided into one or more independent partitions, each of the partitions having a chamber correspondingly, and each chamber having vents correspondingly; an upper cover for sealing the chambers, the upper cover being located on the side of the chambers away from the test platform; and a movable device, the movable device being movable on a surface parallel to the test platform, movable in a direction perpendicular to the test platform, and also adapted to apply pressure on the upper cover so that the upper cover seals the chambers.
A leak test device, the leak test device comprising:
Dependencies are inferred from the claim text.