Method and device with defect detection

Abstract

A method and device with defect detection are included. In one general aspect, a method performed by an electronic device includes determining, by the electronic device, an operation mode among different operation modes, wherein the electronic device is configured to implement the operation modes for determining wafer defects by processing semiconductor wafer images, and determining, by the electronic device, based on an indication of the determined operation mode, whether a semiconductor image, among the semiconductor wafer images, is defective.

Dependencies are inferred from the claim text.