Determining Beam Correspondence Parameters
OwnerPaul Simon Holt LEATHER, Thomas HAUSTEINinventors
Life of this patent
Estimating the term…
Loading patent…
OwnerPaul Simon Holt LEATHER, Thomas HAUSTEINinventors
Estimating the term…
A method for determining a beam correspondence parameter of a device under test includes arranging the device under test within a measurement environment to allow an exchange of a wireless signal with the device under test. The method generating a first beam with the measurement environment for the exchange of the wireless signaland causing causing the DUT to generate, by using an antenna arrangement of the DUT, a second beam, to form a beam pair with the first beam, the beam pair including a TX beam and an RX beam and to generate a third beam corresponding to the second beam. The method includes determining the beam correspondence parameter for the beam pair using characterizing the second beam and a measurement characterizing the third beam.
A computer-implemented method for determining a beam correspondence parameter of a device under test (DUT), the method comprising:
A computer implemented method for determining a phase centre of an antenna arrangement of a DUT, comprising:
A node for a measurement environment comprising:
A measurement environment comprising a plurality of nodes, each node configured for receiving a signal from the DUT and/or transmitting a signal to the DUT, wherein the measurement environment is adapted to implement a virtual link antenna arrangement using the plurality of nodes.
Dependencies are inferred from the claim text.