Sample-analyzing apparatus
AssigneeHitachi High-Tech Corporation
InventorsAkimasa Osaka, Tsukasa Shishika, Shinji Yoshioka
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AssigneeHitachi High-Tech Corporation
InventorsAkimasa Osaka, Tsukasa Shishika, Shinji Yoshioka
Estimating the term…
Provided is a sample-analyzing apparatus that can reduce a difference in the flow rate of a vaporized sample generated by heating a piece of paper to which the sample has adhered. The sample-analyzing apparatus includes a sample introduction unit that generates and suctions a vaporized sample obtained by vaporizing a sample adhered to a piece of paper by heating the piece of paper, and an analysis unit that analyzes the suctioned vaporized sample. The sample introduction unit has a heating surface that comes into contact with the piece of paper and heats the piece of paper, a plurality of flow paths through which the vaporized sample flows are provided in the heating surface, and a suction opening through which the vaporized sample is suctioned is provided in each of the flow paths.
A sample-analyzing apparatus comprising:
Dependencies are inferred from the claim text.