Measurement device, measurement method, and program
AssigneeSony Semiconductor Solutions Corporation
InventorsKAZUKI AKUTAGAWA, YASUNORI TSUKUDA, HIROYUKI HIRANO, NOBORU SAKIMURA, TATSUO KUROIWA
Life of this patent
Estimating the term…
Loading patent…
AssigneeSony Semiconductor Solutions Corporation
InventorsKAZUKI AKUTAGAWA, YASUNORI TSUKUDA, HIROYUKI HIRANO, NOBORU SAKIMURA, TATSUO KUROIWA
Estimating the term…
The present disclosure relates to a measurement device, a measurement method, and a program that enable measurement of a distance with high accuracy in a shorter time. A signal for giving an instruction on emission timing to emit a pulse of laser light is generated repeatedly for each predetermined processing cycle, and a count code indicating timing at which a pulse of reflected light that is the laser light reflected by a distance measurement target and returned is received is continuously counted at the time of switching a processing cycle. Then, an instruction on an emission delay value indicating a time for delaying the emission timing from the start of the processing cycle is given to be different for each processing cycle. The present disclosure can be applied to a measurement device that measures a distance.
A measurement device comprising:
A measurement method comprising:
A program for causing a computer of a measurement device to execute measurement processing comprising:
Dependencies are inferred from the claim text.