Measurement Method, Measurement Device, Measurement System, And Measurement Program
AssigneeSeiko Epson Corporation
InventorYoshihiro KOBAYASHI
Life of this patent
Estimating the term…
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AssigneeSeiko Epson Corporation
InventorYoshihiro KOBAYASHI
Estimating the term…
A measurement method includes: performing low-pass filter processing and high-pass filter processing on target data; estimating correction data; generating vibration component data, and the estimating the correction data includes: specifying a first interval, a second interval, and a third interval; generating first interval correction data, generating second interval correction data in the second interval by setting data in an interval before a first intersection point of first line data and second line data as the first line data, setting data in an interval from the first intersection point to a second intersection point of second line data and third line data as the second line data, and setting data in an interval after the second intersection point as the third line data; and generating third interval correction data.
A measurement method, comprising:
A measurement method, comprising:
A measurement device, comprising:
A non-transitory computer-readable storage medium storing a measurement program, the measurement program causing a computer to execute:
Dependencies are inferred from the claim text.