Semiconductor device including differential input circuit and calibration method thereof
AssigneeSK hynix Inc.
InventorYeonsu JANG
Life of this patent
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AssigneeSK hynix Inc.
InventorYeonsu JANG
Estimating the term…
According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.
A semiconductor device, comprising:
A calibration method of a differential input circuit for outputting an output signal by receiving first and second input signals respectively inputted to first and second input transistors, the calibration method comprising:
A calibrator for calibrating a circuit configured to amplify differential inputs respectively through first and second transistors to generate an output, the calibrator comprising:
Dependencies are inferred from the claim text.