Semiconductor product grading method and grading system

Abstract

The present application discloses a semiconductor product grading method and grading system. The grading method includes: at the time of an electric property test, classifying the several semiconductor products into a plurality of groups according to several test parameters obtained from the test; carrying out a principal component analysis on the corresponding several test parameters in each group, to obtain eigen parameters for each group; and determining, based on the eigen parameters, grades for the semiconductor products in each group. The semiconductor products in each group are graded through several eigen parameters with similar attributes, so the accuracy of the existing semiconductor product grading is improved and the semiconductor products that meet different customer requirements can be accurately and quickly screened out for shipping.

Dependencies are inferred from the claim text.