Terahertz measuring device and method of operating a terahertz measuring device

A method of operating a measuring device comprising a Terahertz, THz, transmitter configured to emit a THz signal (TS) to an object to be measured and a THz receiver configured to receive a reflected portion (TSR) of said THz signal (TS) that has been reflected by said object, wherein said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device, said method comprising:

• A) varying a distance (d) between said measuring head and said object to be measured, emitting, by said THz transmitter, said THz signal (TS) to said object to be measured, receiving said reflected portion (TSR) of said THz signal (TS), and determining a first parameter characterizing a detected signal proportional and/or related to said received reflected portion (TSR) of said THz signal (TS), further including:
• for a plurality of distance values (dv) of said distance (d) between said measuring head and said object to be measured, wherein the plurality of distance values (dv) are within a predetermined first range:
• determining and storing said distance values (dv), determining and storing first reference measurement information characterizing a received reflected portion (TSR) of said THz signal (TS) associated with said at least one distance value (dv);
• and/or
• B) varying a relative angular position of said measuring head with respect to said object to be measured, emitting, by said THz transmitter, said THz signal (TS) to said object to be measured, receiving said reflected portion (TSR) of said THz signal (TS), determining a second parameter characterizing a detected signal proportional or related to said received reflected portion (TSR) of said THz signal (TS), further including:
• for a plurality of relative angular position values of a relative angular position between said measuring head and said object to be measured, wherein the plurality of relative angular position values are of a predetermined second range:
• determining and storing said relative angular position values (apv), determining and storing second reference measurement information characterizing a received reflected portion (TSR) of said THz signal (TS) associated with said at least one relative angular position value.

A measuring device, comprising:

• a Terahertz (THz) transmitter configured to emit a THz signal (TS) to an object to be measured;
• and
• a THz receiver configured to receive a reflected portion (TSR) of said THz signal (TS) that has been reflected by said object, wherein said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device, said measuring device being configured to:
• A) vary a distance (d) between said measuring head and said object to be measured and determine a first parameter (P1) characterizing a detected signal proportional or related to said received reflected portion (TSR) of said THz signal (TS);
• and for a plurality of distance values (dv) of said distance (d) between said measuring head and said object to be measured, wherein the plurality of distance values (dv) are within a predetermined first range, determine and store said distance values (dv), determine and store first reference measurement information (rmi1) characterizing a received reflected portion (TSR) of said THz signal (TS) associated with said at least one distance value (dv);
• and/or
• B) vary a relative angular position (a1) of said measuring head with respect to said object to be measured, emit, by said THz transmitter, said THz signal (TS) to said object to be measured, receive said reflected portion (TSR) of said THz signal (TS), determine a second parameter (P2) characterizing a detected signal proportional or related to said received reflected portion (TSR) of said THz signal (TS);
• and for a plurality of relative angular position values (apv) of a relative angular position between said measuring head and said object to be measured, wherein the plurality of relative angular position values (apv) are of a predetermined second range, determine and store said relative angular position values (apv), determine and store second reference measurement information (rmi2) characterizing a received reflected portion (TSR) of said THz signal (TS) associated with said at least one relative angular position value (apv).