Composition for film formation, resist composition, radiation-sensitive composition, method for producing amorphous film, resist pattern formation method, composition for underlayer film formation for lithography, method for producing underlayer film for lithography, and circuit pattern formation method
AssigneeMitsubishi Gas Chemical Company, Inc.
InventorsTadashi OMATSU, Hiroaki YAMAMOTO, Junya HORIUCHI, Takashi MAKINOSHIMA, Masatoshi ECHIGO
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